System for detection of flaws by use of microwave radiation
US6172510A · kind A · utility
9Cited by
20References
8Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 30, 1998 |
| Grant date | Jan 9, 2001 |
| Priority date | — |
| Expiry date | Dec 30, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N22/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Targeted portions of material layered structure is probed by microwave radiation focussed onto the targeted portion by adjustment of antenna position and orientation establishing a single oblique incidence path for reflection of antenna emitted probing radiation. Signal measurements of the radiation along the oblique incidence path is obtained to provide for evaluation and detection of defects in the targeted portion of the structure being probed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.