Patent · US Expired

Method for detecting the exact contour of targeted treatment areas, in particular, the external contour

US6178345A · kind A · utility

165Cited by
1References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 10, 1999
Grant dateJan 23, 2001
Priority date
Expiry dateMay 10, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30096
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for mapping surgical target site contours precisely, especially the outer contour thereof, comprises the following steps: PA1 producing a plane slice image through the surgery site in the region of the surgery target whereby the plane of the slice image is located substantially perpendicular to a a plane of symmetry of the surgery target site; PA1 assigning the images split by the plane of symmetry, more particularly by mirrowing at the plane of symmetry; and PA1 establishing the difference in the image contents between the assigned split images and processing the resulting information to determine the location of the contour of the surgery target site, especially the outer contour thereof in the plane of the slice image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.