Method for detecting the exact contour of targeted treatment areas, in particular, the external contour
US6178345A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 10, 1999 |
| Grant date | Jan 23, 2001 |
| Priority date | — |
| Expiry date | May 10, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30096
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for mapping surgical target site contours precisely, especially the outer contour thereof, comprises the following steps: PA1 producing a plane slice image through the surgery site in the region of the surgery target whereby the plane of the slice image is located substantially perpendicular to a a plane of symmetry of the surgery target site; PA1 assigning the images split by the plane of symmetry, more particularly by mirrowing at the plane of symmetry; and PA1 establishing the difference in the image contents between the assigned split images and processing the resulting information to determine the location of the contour of the surgery target site, especially the outer contour thereof in the plane of the slice image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.