Probe card
US6181145A · kind A · utility
41Cited by
6References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 13, 1998 |
| Grant date | Jan 30, 2001 |
| Priority date | — |
| Expiry date | Oct 13, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/0735
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe card provides electrical connection between an IC device under test (DUT) and a testing apparatus. The probe card includes: a test chip for transferring a signal between the DUT and the testing apparatus; and a contact bump provided at a position corresponding to a pad of the test chip, wherein the test chip is provided to securely press the contact bump against the DUT, thereby establishing the electrical connection between the DUT and the contact bump.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.