Contact probe
US6181150A · kind A · utility
4Cited by
6References
9Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 5, 1998 |
| Grant date | Jan 30, 2001 |
| Priority date | — |
| Expiry date | Jun 5, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07342
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A contact probe includes a plurality of leads arranged in array on a surface of an insulating film in an intimately contacted manner. A distal end portion of each of the leads is contacted, under pressure, with an electronic part. Each of the leads is provided with an anchor portion projecting from a mating surface thereof with respect to the insulating film and anchored in the insulating film, and the anchor portion is engaged with the insulating film.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.