Method and system for testing an integrated circuit input capacitance, particularly for a contactless operating integrated circuit
US6181152A · kind A · utility
1Cited by
5References
35Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 17, 1998 |
| Grant date | Jan 30, 2001 |
| Priority date | — |
| Expiry date | Nov 17, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2841
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for testing an integrated circuit comprising an input capacitance designed to form, with an antenna coil, a resonant receiver circuit with a predetermined natural frequency. The input capacitance is connected to a test inductance chosen to form, with the input capacitance, a resonant test circuit having a resonant frequency substantially equal to the natural frequency of the resonant receiver circuit. The resonant test circuit is excited by an alternating signal provided through a transformer. The testing of inductive integrated circuits working without contact is implemented in a corresponding test system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.