Patent · US Expired

Dynamic type RAM

US6181618A · kind A · utility

14Cited by
6References
42Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 10, 1998
Grant dateJan 30, 2001
Priority date
Expiry dateMar 10, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/4094
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present invention is to provide a semiconductor memory device capable of realizing a high speed sensing operation and an enlarged sense margin, for ensuring the sensing operation even with a low power source voltage by connecting the bit line of the memory cell array portion and the bit line of the sense amplifier portion via the P-type transfer gate, having the bit line amplitude of the sense amplifier potion larger than the bit line amplitude of the memory cell array portion, and having different precharge voltages for the bit line of the sense amplifier portion and the bit line of the memory cell array portion.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.