X-ray scanning method and apparatus
US6183139A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 6, 1998 |
| Grant date | Feb 6, 2001 |
| Priority date | — |
| Expiry date | Oct 6, 2018 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2235/081
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method for scanning an x-ray target in a reverse geometry x-ray imaging system with a charged particle beam is disclosed. An aspect of the invention is directed to scanning patterns for moving an electron beam across the target assembly to generate x-rays, in which a charged particle beam is moved across a plurality of sets of positions on a target assembly, wherein particular positions or sets of positions on the target assembly are rescanned a plurality of times during a single frame. The length of time between a first and a last illumination of the object during the frame is sufficiently small to prevent image blurring during image reconstruction.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.