Method of spectral nondestructive evaluation
US6184528A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 27, 1998 |
| Grant date | Feb 6, 2001 |
| Priority date | — |
| Expiry date | Aug 27, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8427
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In accordance with the present invention, there is provided a spectral nondestructive method for evaluating substrate surface characteristics of a sample substrate. The sample substrate has a sample substrate surface and a generally visually nontransmissive sample coating disposed on the sample substrate surface. The sample coating is transmissive within a first infrared spectral wavelength range and the sample substrate is reflective within the first infrared spectral wavelength range. The method begins with directing infrared radiation from an infrared radiation source towards the coated sample substrate. Specular and diffuse infrared radiation reflected from the coated sample substrate is collected. The reflected radiation is measured as a function of wavelength in the first infrared spectral wavelength range to obtain measured reflectance data representative of the reflectance of the coated sample substrate. The measured reflectance data is compared to reference reflectance data representative of a sample substrate surface having a known physical characteristic within the first wavelength range to obtain differential data. The differential data is correlated to physical charact…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.