Patent · US Expired

Circuit and method for enabling semiconductor device burn-in

US6185139A · kind A · utility

13Cited by
6References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 12, 2000
Grant dateFeb 6, 2001
Priority date
Expiry dateJan 12, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3004
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An integrated circuit device includes low voltage internal circuitry and a first external pin which receives a first information signal. The first information signal provides operating information within a predetermined voltage range. The device includes a mode detector coupled to the first external pin. The mode detector provides a mode enable signal in response to the first information signal being at a voltage that is outside the predetermined voltage range. The device further includes a switchable regulator which provides a supply voltage to the low voltage internal circuitry to power the low voltage internal circuitry at a regulated voltage in a normal mode of the integrated circuit memory and at a higher voltage than the regulated voltage in response to the mode enable signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.