Patent · US Expired

Method and device for obtaining a desired phase of optical characteristic of a fabry-perot etalon

US6186937A · kind A · utility

13Cited by
2References
35Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 30, 1999
Grant dateFeb 13, 2001
Priority date
Expiry dateJul 30, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B5/284
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A method and device for obtaining a desired phase of optical characteristic of a Fabry-Perot (FP) etalon using multiple optical detectors which, while passively aligned at various positions relative to an incident light beam, detect different phases of light signal emerging from the FP etalon. An FP etalon and optical detector array constructed in accordance with the present invention may be used as a frequency discriminator in an optical system where the FP etalon optical characteristic is required to have a particular phase.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.