Display apparatus having test elements under or bounded by the sealant
US6188453A · kind A · utility
8Cited by
3References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 29, 1998 |
| Grant date | Feb 13, 2001 |
| Priority date | — |
| Expiry date | Sep 29, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/136254
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
In a LCD with a built-in driver, the quality of all elements is judged. A test TFT is formed immediately below a sealing material which bonds a TFT substrate and an opposite substrate, wherein test terminals are pulled out onto the eaves section of the TFT substrate protruding from the opposite substrate. The quality of TFTs are judged by considering changes of TFT characteristics under the conditions before and after the bonding process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.