Method of using a microscopic digital imaging strain gauge
US6189386A · kind A · utility
3Cited by
11References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 5, 1997 |
| Grant date | Feb 20, 2001 |
| Priority date | — |
| Expiry date | Dec 5, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of using a microscopic digital imaging strain gauge includes the steps of creating a mark pattern on an object surface, positioning an image sensing device over the mark pattern, magnifying the mark pattern with a magnification lens, taking a first magnified image of the mark pattern with the image sensing device, applying a load to the object surface, taking a second magnified image of the mark pattern, and utilizing a processor to calculate the strain as derived from the first and second magnified images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.