Fan and pencil beams from a common source for x-ray inspection
US6192104A · kind A · utility
211Cited by
12References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 24, 1999 |
| Grant date | Feb 20, 2001 |
| Priority date | — |
| Expiry date | Nov 24, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V5/222
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for inspecting an object, where both a fan beam and a pencil beam of penetrating radiation are used to illuminating the object concurrently. Both beams may be derived from a single source of penetrating radiation. The pencil beam is noncoplanar with the fan beam and may be scanned with respect to the object. Radiation scattered from the pencil beam within the object is detected, and the scatter signal thus generated is used in conjunction with a transmission signal which characterizes attenuation of the fan beam by the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.