Process for determining the thickness of a layer of electroconductive material deposited on a body

US6198278A · kind A · utility

Assignee

• Robert Bosch GmbH · DE

Inventors

• Klaus Dobler · Gerlingen, DE
• Hansjoerg Hachtel · Rutesheim, DE
• Reinhard Dimke · Stuttgart, DE
• Franz Auf der Heide · Litzendorf, DE
• Richard Blattert · Murr, DE
• Josef Weber · Oberriexingen, DE

Key dates

• Filing date: Apr 30, 1999
• Grant date: Mar 6, 2001
• Expiry date: Apr 30, 2019

Classification

• Technology area (CPC G): Physics
• CPC primary: G01B7/105
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A process for determining a thickness of a layer of electrically conductive material, any measurement errors are converted into dimensionless norm values with the aid of a normalization process. In this conversion, measurement errors, for example due to temperature drift and different electrical and magnetic properties of the base material of the carrying body can be largely eliminated. These norm values are converted into layer thickness values with the aid of a calibration curve.