Method of using a hybrid error metric for multi-resolution mesh generation
US6198486A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 23, 1998 |
| Grant date | Mar 6, 2001 |
| Priority date | — |
| Expiry date | Sep 23, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T17/20
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Generating a multi-resolution mesh from an original mesh representing a scene or object is achieved by collapsing edges of the original mesh in a first order defined by a surface area error metric to produce a modified mesh, and collapsing edges of the modified mesh in a second order defined by a combination quadric and surface area error metric to produce a multi-resolution mesh. The transition from using the surface area error metric to the combination of the surface area error metric and the quadric error metric occurs when a cost for removing one of the edges from the mesh as determined by the surface area error metric exceeds a threshold. A volume error metric may be used in conjunction with the surface area error metric in collapsing edges of the mesh to allow an edge collapse only when the volume error metric for the edge indicates collapsing the edge will not substantially alter the shape of the mesh.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.