Patent · US Expired

Sensing circuit for semiconductor device and sensing method using the same

US6198661A · kind A · utility

6Cited by
9References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 10, 1999
Grant dateMar 6, 2001
Priority date
Expiry dateAug 10, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/26
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Sensing circuit for a semiconductor device and a sensing method using the same which allows sensing of a selected nonvolatile memory cell at a low voltage, a low power, and a fast speed, and has a high sensing reliability, the circuit including a bitline connected to a drain terminal of a memory cell through a Y-decoder, a senseline for sensing, and forwarding a data in the memory cell, a switching unit for switching between the bitline and the senseline, a first current supply unit disposed between a power source and the bitline for supplying a current to the bitline to the memory cell, a second current supply unit disposed between the power source and the senseline for supplying a current to the senseline, a voltage level shifter for providing a voltage difference between the bitline and the senseline, and a sense MOS transistor disposed between the senseline and the ground voltage and having a gate terminal connected to one end of the voltage level shifter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.