Exposure control for digital radiography systems using charge build-up in sensor array pixels
US6198800A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 16, 1998 |
| Grant date | Mar 6, 2001 |
| Priority date | — |
| Expiry date | Sep 16, 2018 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/76
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The x-ray exposure of an image pixel array (202) is measured by assigning to certain pixels (209ep) of the array the task of measuring the level of exposure. A target set (209) of pixels from array (202) is selected and divided into a set of exposure pixels (209ep) and a set of image pixels (209ip). Both sets of pixels generate and collect electrical charges in proportion to the amount of x-ray exposure experienced by them. The charges collected by the exposure pixels (209ep) are continuously read out during the capture of an image and compared with a desired exposure level. Once the desired exposure level is reached, as indicated by the exposure pixels (209ep), the image pixels (209ip) are read out and an image is produced.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.