Non-uniform development indicator
US6198885A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 5, 1998 |
| Grant date | Mar 6, 2001 |
| Priority date | — |
| Expiry date | Mar 5, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03G2215/00042
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A method to provide a highly intelligent, automated diagnostic system that identifies the need to replace specific parts to minimize machine downtime rather than require extensive service troubleshooting. In particular, a systematic, logical test analysis scheme to assess machine operation from a simple sensor system and to be able to pinpoint parts and components needing replacement is provided by a series of first level of tests by the control to monitor components for receiving a first level of data and by a series of second level of tests by the control to monitor components for receiving a second level of data. Each of the first level tests and first level data is capable of identifying a first level of part failure independent of any other test. Each of the second level tests and second level data is a combination of first level tests and first level data or a combination of a first level test and first level data and a third level test and third level data. The second level tests and second level data are capable of identifying second and third levels of part failure. Codes are stored and displayed to manifest specific part failures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.