Patent · US Expired

Apparatus and method for testing leaf springs

US6199427A · kind A · utility

9Cited by
3References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 3, 1998
Grant dateMar 13, 2001
Priority date
Expiry dateDec 3, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/029
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A leaf spring test apparatus, generally comprising a frame constructed and arranged to support a first end and a second end of a leaf spring, a force applicator disposed on the frame for applying a force to a predetermined area of the leaf spring, a force measurement gauge connected to the force applicator to gauge the amount of force applied to the leaf spring by the force applicator, and a distance measurement gauge connected to the leaf spring to gauge movement of the leaf spring upon the application of force by the force applicator to the leaf spring. A method for testing and measuring the spring rate of leaf springs, comprising the steps of installing a leaf spring on a leaf spring test apparatus, zeroing a leaf spring test apparatus, pumping a jack on the leaf spring test apparatus to raise the leaf spring a desired distance, and reading a force measurement gauge.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.