Use of inorganic particles and method for making and identifying a substrate or an article
US6200628A · kind A · utility
31Cited by
8References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 2, 1998 |
| Grant date | Mar 13, 2001 |
| Priority date | — |
| Expiry date | Oct 2, 2018 |
Classification
- Technology area (CPC C)Chemistry; Metallurgy
- CPC primaryC09C2220/20
- WIPO fieldBasic materials chemistry
- WIPO sectorChemistry
Abstract
The present invention relates to inorganic particles comprising at least two chemical elements in a predefined and analytically identifiable ratio. These particles are used as a marking means incorporated into or applied onto any desired article. They provide a high security potential against counterfeiting since the analysis depend on a combination of spatial as well as of chemical information. In a first step the information containing particle has to be localized by scanning electron microscopy and in a second step the ratio of elements is analysed using energy--or wavelength--dispersive X-ray analysis (SEM/EDX).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.