Patent · US Expired

Testing system for measuring and optimising target tracking systems

US6201231A · kind A · utility

2Cited by

2References

8Claims

0Family size

Assignee

Diehl Stiftung & Co. KG · DE

Inventors

Martin Regensburger · Dresden, DE
Peter Kassens · Crimmitschau, DE

Key dates

Filing date	Oct 1, 1998
Grant date	Mar 13, 2001
Priority date	—
Expiry date	Oct 1, 2018

Classification

Technology area (CPC G)Physics
CPC primaryG01S17/66
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Described is a testing system which has a target point light source (12), a tracking light source (18) and therebetween a projection wall (24). Associated with the target point light source (12) is a two-axis deflection device (28) which is connected together with a target point computer (14). Associated with the tracking light source (18) is a two-axis scanner device (30) which is connected together with a tracking computer (20). Provided between the tracking light source (18) and the two-axis scanner device (30) is a beam splitter (32) with which a sensor device (42) is associated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.