Scannable fuse latches
US6201750A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 21, 2000 |
| Grant date | Mar 13, 2001 |
| Priority date | — |
| Expiry date | Jun 21, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C17/18
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Scannable fuse latches are provided that can override current fuse values, read current fuse values, and latch current fuse values. Using the scannable fuse latches of the current invention allows current fuse values to be overridden, which can be important in testing and failure analysis to place the integrated circuit in a known state. The scannable fuse latches of the current invention also allow current fuse values to be read. This aids failure analysis because the current state of the failed integrated circuit can be determined. Finally, the scannable fuse latches of the present invention allow the current state of fuses to be latched and provided to a core of an integrated circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.