Patent · US Expired

Semiconductor memory device and method for producing same

US6204527A · kind A · utility

15Cited by
1References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 30, 1998
Grant dateMar 20, 2001
Priority date
Expiry dateNov 30, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/665

Abstract

A semiconductor memory device comprises: a semiconductor substrate; a semiconductor region of a first conductive type formed in the semiconductor substrate; a diffusion region of a second conductive type different from the first conductive type, the diffusion region being formed on the surface of the semiconductor region; a trench formed in the semiconductor substrate so as to be adjacent to the diffusion region; a capacitor insulator film formed on a portion of a side surface of the trench, which extends from a position at a predetermined depth of the trench to a bottom portion of the trench, and on a bottom surface of the trench; a storage node formed so that a surface of the storage node buried in the trench has the same depth as that of the predetermined depth; a first insulator film formed in a portion of the side surface of the trench above the position of the predetermined depth of the trench, the first insulator having a window in a region contacting the diffusion region; and a storage node electrode formed on the storage node so as to bury the trench, the uppermost surface of a region of the storage node electrode contacting the diffusion region via the window being formed…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.