Method and apparatus for two-dimensional vibration analysis
US6209396A · kind A · utility
5Cited by
2References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 16, 1999 |
| Grant date | Apr 3, 2001 |
| Priority date | — |
| Expiry date | Feb 16, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01H9/002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and an apparatus are provided for contact-free optical displacement and/or vibration measurement of an object, in which the object to be measured is scanned in the form of a grid. The position of the measurement points and the contour of the grid are freely selectable. Individual measurement point subquantities, to be analyzed respectively in correlation with one another, can be classified in different categories and analyzed as a function of the category to which they are assigned.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.