High accuracy measuring system
US6215319A · kind A · utility
Inventors
Key dates
| Filing date | Jul 31, 1998 |
| Grant date | Apr 10, 2001 |
| Priority date | — |
| Expiry date | Jul 31, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D3/063
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measuring system for measuring a variable physical parameter by varying a reference signal above and below the magnitude of the physical parameter. The difference between the varying reference and the varying physical parameter is used to create an output signal representative of the magnitude of the parameter. A preferred embodiment of the invention uses a feedback-controlled system to vary the reference in such manner as to cause the time integral of the difference to be minimized. The reference is varied at a controlled rate, and the direction in which the reference is being varied is reversed when a function of the difference reaches some predetermined level. A function of the limits between which the reference has recently been varied is representative of the magnitude of the physical parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.