Dynamic burn-in test equipment
US6215324A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jan 5, 2000 |
| Grant date | Apr 10, 2001 |
| Priority date | — |
| Expiry date | Jan 5, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2879
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
There is provided a dynamic burn-in test equipment being capable of testing a large number of multi-pin LSI chips in a short test time and at a low cost. The dynamic burn-in test equipment includes at least a thermostatic oven for storing DUTs, a driving unit for applying the input signal to the input terminal of each DUT to apply a predetermined expected value to the output terminal of each DUT, a power supply for applying a predetermined power supply voltage to each DUT through a higher level power supply line and a lower level power supply line (ground line), and a current detector arranged on at least one of the higher level power supply line and the lower level power supply line (ground line). The dynamic burn-in test equipment monitors a power supply current to detect a failure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.