Method and system for testing multiport memories
US6216241A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 8, 1998 |
| Grant date | Apr 10, 2001 |
| Priority date | — |
| Expiry date | Oct 8, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C8/16
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A memory device has first and second sets of memory cells. Each of the cells in the second set is a neighboring cell corresponding to a respective cell of the first set. A data generating function generates a first pattern and a second pattern. A controller causes the first pattern to be written in the first set of memory cells, causes each cell in the second set of memory cells to be read simultaneously while the corresponding neighboring cell in the first set of memory cells is being written to, and causes a datum to be read from each cell in the second set of memory cells after the corresponding neighboring cell in the first set of memory cells is written to. An output data evaluator determines whether the data read from the second set of memory cells match the second pattern, and detects a fault in the memory device, if the data read do not match the second pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.