Method and apparatus for measuring waviness of paper
US6219141A · kind A · utility
5Cited by
3References
11Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 12, 2000 |
| Grant date | Apr 17, 2001 |
| Priority date | — |
| Expiry date | Jan 12, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/065
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides a simple and efficient method and apparatus for carrying out a quantitative measurement of waviness in a sample of paper. This is done by stretching the paper sample to the point where all waviness is removed and measuring the elongation produced at that point. The observation of waviness and its removal is facilitated by illumination of the paper sample with low incidence light while the sample is being stretched.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.