Patent · US Expired

Method and apparatus for determining wave characteristics from wave phenomena

US6219142A · kind A · utility

65Cited by
6References
21Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 16, 1998
Grant dateApr 17, 2001
Priority date
Expiry dateOct 16, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J9/02
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus and method for determining wave characteristics from wave phenomena. The apparatus and method employ eigenvectors to yield a variety of wave characteristics from wave phenomena data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.