Method and apparatus for inspecting a display using a relatively low-resolution camera
US6219443A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Aug 11, 1998 |
| Grant date | Apr 17, 2001 |
| Priority date | — |
| Expiry date | Aug 11, 2018 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S345/904
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The present invention provides a method and apparatus for detecting defects in a display. The apparatus of the present invention comprises a camera for capturing an image of a display being inspected and processing circuitry, such as, for example, a microprocessor or a digital signal processor (DSP), for processing the captured image to determine whether or not the display being inspected is defective. Preferably, the processing circuitry is a microprocessor running image processing software which controls data acquisition as well as the processing of the acquired data to determine whether the display being inspected is defective. In accordance with the present invention, a relatively high resolution display can be inspected using a single camera, preferably a charge-coupled device (CCD) camera, which has a lower resolution than the display being inspected. The camera is focused on the display such that the entire display is within the field of view of the camera. The camera then captures an image of the display, digitizes the image and stores the digitized image in a memory device which is in communication with the processing circuitry. The processing circuitry then reads the imag…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.