Patent · US Expired

Method and apparatus for testing material utilizing differential temperature measurements

US6220748A · kind A · utility

8Cited by
25References
12Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 15, 1999
Grant dateApr 24, 2001
Priority date
Expiry dateJan 15, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N1/125
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for timely and accurate measurement of material parameters are disclosed. A test sensor measures the temperature of a sample of material as it is heated up and/or cooled down. A reference sensor is used to obtain differential temperature measurements as the temperature of the test sample is varied. A differential temperature trace is generated and analyzed in order to determine various characteristics of the material being tested. In one embodiment, the sodium fluoride to aluminum fluoride ratio (NaF:AlF.sub.3) and alumina concentration in a Hall bath aluminum smelting operation are determined in order to efficiently control smelting of aluminum metal. In this embodiment, bath temperature and liquidus temperature may be measured and compared in order to determine the amount of superheat of the bath and to prevent the operation of smelters at higher temperatures than necessary.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.