Method and apparatus for testing X servers
US6223306A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 27, 1998 |
| Grant date | Apr 24, 2001 |
| Priority date | — |
| Expiry date | Feb 27, 2018 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S707/99948
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention comprises a testing system for testing X Servers. The testing system comprises a test harness that communicates with an X Server being tested to obtain the test results therefrom, an archive database for storing test archives to be used by the test harness for testing the X Server, a test result storage database for storing results of an X Server test, and a viewing tool that presents the user with a result file which the user analyzes to determine the X Server defect. Preferably, the test harness is object-oriented code that has a polymorphic and hierarchical structure. The basic units of the test harness are objects, such as display connections, screens, graphics contexts, pixmaps, colormaps and windows. Within the test context, each object encodes a unique hierarchy that indicates its dependencies on other test harness objects. These objects encapsulate Xlib routines and hide much of the detail of Xlib programming from the test writer, thus facilitating the test writer in writing tests. Once a test has been written, the test is run and the results of the test, if they are correct, are stored as an archive file in the test archive storage database for later …
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.