Temperature level detection circuit
US6225851A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Apr 19, 2000 |
| Grant date | May 1, 2001 |
| Priority date | — |
| Expiry date | Apr 19, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K7/01
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention concerns a temperature level detection circuit including means (B1, B2, B3, 11, 12, 21, 31, 32) for generating diode voltages (V.sub.BE1 to V.sub.BE5) and calculating means including capacitive elements (51, 52, 53) and switching means (SW1 to SW4) arranged to connect selectively and sequentially, during first and second phases, the capacitive elements (51, 52, 53) to the means generating said diode voltages (V.sub.BE1 to V.sub.BE5). During the second phase, the calculating means generating a temperature signal representative of the temperature level being greater than or less than a determined temperature threshold (T.sub.limit) defined as the temperature value for which the equation .alpha..sub.1 (V.sub.BE2 -V.sub.BE1)+.alpha..sub.2 (V.sub.BE3 +.alpha..sub.3 (V.sub.BE5 -V.sub.BE4)) becomes zero, where .alpha..sub.1, .alpha..sub.2, and .alpha..sub.3 are first, second and third proportionality coefficients determined by the values of the capacitive elements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.