Patent · US Expired

Protection scheme for multi-transistor amplifiers

US6225867A · kind A · utility

8Cited by
1References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 23, 1997
Grant dateMay 1, 2001
Priority date
Expiry dateDec 23, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03F2203/21178
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

The present invention deals with the problems related to thermal runaway and over-voltage breakdown in integrated circuits using a series of power transistors interconnected in a parallel circuit arrangement. The general technique described consists of a protection scheme that involves the application of a fusible material to form ballast resistor components. These components are connected in series with each of the transistors in the integrated circuits. The main advantages are significant area and cost savings in the manufacturing of the integrated circuits as well as an increase in their yield, thereby reducing costly field maintenance and equipment returns.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.