Patent · US Expired

Integrated-optic spectrometer and method

US6226083A · kind A · utility

14Cited by
2References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 5, 1999
Grant dateMay 1, 2001
Priority date
Expiry dateMay 5, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B2006/12176
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An integrated-optic spectrometer is disclosed for analyzing the composition of light reflected off a sample under analysis. In a simplified embodiment, the spectrometer includes a buffer, located on the top of a substrate, which is etched to create a diffraction grating having grating lines. The diffraction grating and grating lines are formed to provide diffraction of discrete wavelengths of light, while providing for maximum transmission of non-diffracted wavelengths. A waveguide is fabricated on top of the etched buffer through which the reflected light is directed. A photodiode detector array is located above the waveguide into which the diffracted wavelengths are diffracted, providing an analysis of the composition of the reflected light. A clad encompasses the integrated-optic spectrometer, thereby providing protection from outside interference.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.