Patent · US Expired

Method and apparatus for improving RF contact positioning in an RF test socket

US6227878A · kind A · utility

0Cited by
7References
19Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 26, 1999
Grant dateMay 8, 2001
Priority date
Expiry dateJul 26, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/045
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for improving RF contact positioning in a RF test socket is disclosed. The RF test socket comprises a housing having a plurality of notches along one side for clamping to a RF test board and postioning a plurality of contacts in the notches between the housing and the RF test board. The plurality of notches are formed in a step fashion wherein when the housing is clamped to the RF test board, the housing deflects such that the plurality of contacts contact the RF test board with equal force. The plurality of notches are lower in a center of the housing and higher along the edges thereby defining a catenary shape of notches along the housing and are further machined to a specific height for applying equal force or the plurality of contacts.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.