Patent · US Expired

Method to fabricate split-gate with self-aligned source and self-aligned floating gate to control gate

US6228695A · kind A · utility

39Cited by
10References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 27, 1999
Grant dateMay 8, 2001
Priority date
Expiry dateMay 27, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/035

Abstract

A split-gate flash memory cell having self-aligned source and floating gate self-aligned to control gate is disclosed as well as a method of forming the same. This is accomplished by depositing over a gate oxide layer on a silicon substrate a poly-1 layer to form a vertical control gate followed by depositing a poly-2 layer to form a spacer floating gate adjacent to the control gate with an intervening intergate oxide layer. The source is self-aligned and the floating gate is also formed to be self-aligned to the control gate, thus making it possible to reduce the cell size. The resulting self-aligned source alleviates punch-through from source to control gate while the self-aligned floating gate with respect to the control gate provides improved programmability. The method also replaces the conventional poly oxidation process thereby yielding improved sharp peak of floating gate for improved erasing and writing of the split-gate flash memory cell.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.