Patent · US Expired

Semiconductor memory device capable of securing large latch margin

US6229757A · kind A · utility

21Cited by
6References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 21, 1999
Grant dateMay 8, 2001
Priority date
Expiry dateMay 21, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C7/22
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

In a double data rate type synchronous dynamic random access memory (DDR-SDRAM) device, a large latch margin of input data is secured. The DDR-SDRAM device is arranged by a data strobe signal processing circuit for detecting at least one of a rise edge of a data strobe signal and a fall edge thereof to thereby produce at least a first one-shot pulse signal; a clock signal processing circuit for detecting a rise edge of a clock signal to thereby produce a second one-shot pulse signal; and a data-in processing circuit for latching input data by using the first one-shot pulse signal produced from the data strobe signal, and further for latching the latched input data by using the second one-shot pulse signal produced from the clock signal, and also for simultaneously writing both the latched data into a memory cell in a parallel manner. The data-in processing circuit controls a delay amount of the first one-shot pulse signal and another delay amount of the second one-shot pulse signal so as to secure a latch margin of the input data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.