Patent · US Expired

Method and apparatus for extracting and storing connectivity and geometrical data for a deep sub-micron integrated circuit design

US6230299A · kind A · utility

252Cited by
3References
48Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 31, 1998
Grant dateMay 8, 2001
Priority date
Expiry dateMar 31, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/398
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A data extraction tool is provided to extract filtered connectivity and geometrical data for specified layout cell hierarchies of an integrated circuit (IC) design, e.g. a deep sub-micron IC design. The connectivity and geometrical data for each layout cell hierarchy are extracted at least in part in accordance with specified parasitic effect windows. In one embodiment, the data extraction tool includes a filtered extraction function that operates to extract connectivity and geometrical data for layout nets of each layout cell hierarchy of the IC design, one or more layout nets at a time. Additionally, one or more filtered databases are provided to store the filtered connectivity and geometrical data of the layout cell hierarchies.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.