Patent · US Expired

Bipolar silicon-on-insulator structure and process

US6232649A · kind A · utility

22Cited by
22References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 12, 1994
Grant dateMay 15, 2001
Priority date
Expiry dateDec 12, 2014

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D86/01

Abstract

A process for fabricating a bipolar transistor on a silicon-on-insulator substrate which includes etching a bipolar transistor area into the substrate, wherein the bipolar transistor area has substantially vertical sidewalls and a bottom, and forming a buried collector in bottom of the bipolar transistor area. Polysilicon sidewalls are formed adjacent to the vertical sidewalls in the bipolar transistor area, wherein the polysilicon sidewalls are connected to the buried collector. The polysilicon sidewalls are oxidized to form a layer of oxidized polysilicon. Oxide sidewalls are formed on the oxidized polysilicon sidewalls, and epitaxial silicon is formed to fill the bipolar transistor area. A base and an emitter are formed for the bipolar transistor, within the epitaxial barrier.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.