Storage device with the ability to check for defects in same
US6233108A · kind A · utility
25Cited by
6References
13Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Apr 7, 1997 |
| Grant date | May 15, 2001 |
| Priority date | — |
| Expiry date | Apr 7, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2220/20
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
All storage areas constituting a storage medium are checked for defects by successively reading and writing data. If an error that has occurred owing to the checking operation is an error for which retry is possible, the number of times this occurs is accumulated in a retrial-count storage area of a memory. A faulty storage area is detected based upon the type of error that has occurred by checking and/or the number of occurrences that have been accumulated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.