Combination advanced corneal topography/wave front aberration measurement
US6234631A · kind A · utility
60Cited by
3References
4Claims
0Family size
Assignee
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Key dates
| Filing date | Mar 9, 2000 |
| Grant date | May 22, 2001 |
| Priority date | — |
| Expiry date | Mar 9, 2020 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B3/107
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method for the simultaneous measurement of the anterior and posterior corneal surfaces, corneal thickness, and optical aberrations of the eye. The method employs direct measurements and ray tracing to provide a wide range of measurements for use by the ophthalmic community.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.