Patent · US Expired

High-throughput screening method and apparatus

US6235520A · kind A · utility

68Cited by
6References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 14, 1999
Grant dateMay 22, 2001
Priority date
Expiry dateMay 14, 2019

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC40B60/14
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

High-throughout screening method and apparatus are described. The method includes placing cells on a substrate defining a plurality of discrete microwells, at a well density of greater than about 100/cm.sup.2, with the number of sells in each well being less that about 1000, and where the cells in each well have been exposed to a selected agent. The change in conductance in each well is determined by applying a low-voltage, AC signal across a pair of electrodes placed in that well, and synchronously measuring the conductance across the electrodes, to monitor the level of growth or metabolic activity of cells contained in each well. Also disclosed is an apparatus for carrying out the screening method.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.