Patent · US Expired

Method and apparatus for wireless radio frequency testing of RFID integrated circuits

US6236223A · kind A · utility

288Cited by
51References
56Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 10, 1999
Grant dateMay 22, 2001
Priority date—
Expiry dateFeb 10, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3025
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for wireless radio frequency (RF) testing of radio frequency identification integrated circuits (RFID IC) is disclosed. A fixture is provided for physically and electrically contacting the RFID IC to feed an RF interrogating signal into the RFID IC and receive an RF return signal generated in response thereto. The fixture is coupled to a tester via first and second couplers (interconnected to the fixture and tester, respectively) which establish a wireless link for transmitting and receiving the RF interrogation signal and the RF return signal thereby allowing full and accurate RF characterization of the RFID IC.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.