Polarized interferential measurement wherein the modulation signal is adjusted to be equal to the duration of the measurement window
US6239877A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jan 26, 1999 |
| Grant date | May 29, 2001 |
| Priority date | — |
| Expiry date | Jan 26, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/45
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention is an interferential refractometry method and device using fine measurement of the displacement of the fringes of an interference pattern between two light beams with one of the beams undergoing phase variations due to variations in the refractive index thereof. The method comprises application, to one of the two beams, of a relatively fast periodic phase modulation by a modulating signal. Displacement of the fringes resulting from the combined application of the two modulations is picked up by a photodetector and a measuring system evaluates the slow modulation by determining the frequency spectrum of the signal coming from the detect or and measuring the phase shift affecting the fundamental frequency of this frequency spectrum. The method may be applied to detection of variations in the composition of mixtures, for example in analytical or preparative chromatography.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.