Method and apparatus to measure jitter.
US6240130A · kind A · utility
16Cited by
4References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 28, 1998 |
| Grant date | May 29, 2001 |
| Priority date | — |
| Expiry date | Jul 28, 2018 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/1071
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A system and method for measuring jitter. One class of embodiments is particularly useful for testing the aperture jitter of a high speed Analog to Digital (A/D) converter. Aperture jitter in a Sample and Hold circuit (S/H) or in an A/D converter introduces noise into the sampled signal, which is more extreme in areas of the input waveform that have a steep positive or negative slope. The preferred embodiment allows an easy and inexpensive way to measure aperture jitter in S/H and A/D circuits. The technique can also be adapted for measuring edge jitter in digital clock signals or in analog sine wave signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.