Method and apparatus measuring parameters of material
US6242927A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 23, 1998 |
| Grant date | Jun 5, 2001 |
| Priority date | — |
| Expiry date | Feb 23, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/223
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for measuring at least one parameter of material are disclosed herein. The method includes generating multiple frequency signals having frequencies selectable by control signals, combining the multiple frequency signals into a combined frequency signal having multiple frequency components, and applying the combined frequency signal as an excitation signal to a sensing element. The frequency response of the material is determined at each of the multiple frequencies using output signals from the sensing element, and a frequency analysis is performed to determine the parameters of the material. The sensing element may include a capaciflector sensor located non-intrusively along the surface of a conveyor. However, other sensing elements such as capacitive, resistive and inductive elements may be used. The parameters being measured may include mass flow rate and moisture content. The apparatus includes a frequency generating circuit for generating a frequency signal having multiple frequency components, a sensing circuit which applies the frequency signal as an excitation signal to a sensing element, a signal conditioning circuit which determines the frequency res…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.