Hot carrier measuring circuit
US6242937A · kind A · utility
43Cited by
5References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 6, 1999 |
| Grant date | Jun 5, 2001 |
| Priority date | — |
| Expiry date | May 6, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2648
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A hot carrier measuring circuit of the present invention, which measures the characteristic degradation of a semiconductor device due to AC operation, includes a pulse generator generating at least two pulse signals which are partially overlapped with each other and have various duty ratios, a level shifter shifting the pulse signal which are generated in the pulse generator to a desired voltage level, and a measuring device receiving the pulse signals outputted from the level shifter to at least one terminal thereof.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.