Method for data matrix print quality verification
US6244764A · kind A · utility
35Cited by
18References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 21, 2000 |
| Grant date | Jun 12, 2001 |
| Priority date | — |
| Expiry date | Jan 21, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06K5/00
- WIPO fieldTextile and paper machines
- WIPO sectorMechanical engineering
Abstract
A method of verifying data matrix print quality utilizing center offset for dot peen or inkjet marks, and size offset for laser etched or printed marks. The method of the present invention builds on the AIM specification and provides additional measures to determine the quality of the data matrix marks. Center offset and size offset measurements are employed to determine the data matrix quality.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.