Patent · US Expired

X-ray examination apparatus with X-ray image sensor matrix and correction unit

US6246746A · kind A · utility

7Cited by

2References

3Claims

0Family size

Assignee

U.S. Philips Corporation · US

Inventors

Norbert Conrads · Raeren, BE
Martin Weibrecht · Aachen, DE
Ulrich Schiebel · Aachen, DE
Herfried Karl Wieczorek · Aachen, DE

Key dates

Filing date	Aug 19, 1998
Grant date	Jun 12, 2001
Priority date	—
Expiry date	Aug 19, 2018

Classification

Technology area (CPC H)Electricity
CPC primaryH04N25/626
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

An x-ray examination apparatus comprises an x-ray image sensor matrix (1) for deriving an initial image signal from the x-ray image. The sensor elements of the x-ray sensor matrix convert incident x-rays into electric charges. These electric charges are read-out and converted into the initial image signal. Further a correction unit (2) is provided for correcting the initial image signal, notably for disturbances due to delayed transferred charges, that have been retained in the sensor elements for some time. The correction unit (2) is provided with a memory which stores correction values. Further the correction provided with a selection unit (5) for selecting appropriate correction values from the memory (3).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.